On necessary and nonconflicting assignments in algorithmic test pattern generation

Test and Test Bench Generation by Algorithmic Models

Each circuit may be described at the algorithmic, behavioural or gate levels. Normally the tests are generated separately for each of the levels. We present here a technique of generating test patterns for faults by a simulation of descriptions of the circuits on the algorithmic level. The resultant tests are applicable for VHDL behavioural level as test bench. They give high fault coverage for...

Test Pattern Generation and Test Application Time

As the complexity of VLSI circuits is increasing at the rate predicted by Moore's law and the switching frequencies are approaching a gigahertz, testing cost is becoming an important factor in the overall IC manufacturing cost. Testing cost is incurred by test pattern generation and test application processes. In this dissertation, we address both of these factors contributing to the testing co...

wind farm impact on generation adequacy in power systems

در سال های اخیر به دلیل افزایش دمای متوسط کره زمین، بشر به دنبال روش های جایگزین برای تامین توان الکتریکی مورد نیاز خود بوده و همچنین در اکثر نقاط جهان سوزاندن سوخت های فسیلی در نیروگاه های حرارتی به عنوان مهم ترین روش تولید توان الکتریکی مطرح بوده است. به دلیل توجه به مسایل زیست محیطی، استفاده از منابع انرژی تجدید پذیر در سال های اخیر شدت یافته است. نیروگاه های بادی به عنوان یک منبع تولید توان...

The Pitfalls of Necessary Assignments

Pattern-Constrained Test Case Generation

In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In contrast, the proposed method allows for a transparent and intuitive modeling of the relations contained in the test data. For the presented approach, we utilize a general-purpose data generator: It relies on easy to und...